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Proceedings Paper

Ground test characterization of the multiband imaging photometer for SIRTF (MIPS)
Author(s): Erick T. Young; George H. Rieke; James Cadien; Herve A. Dole; Charles W. Englebracht; Karl D. Gordon; Gerald B. Heim; Douglas M. Kelly; John A. Stansberry
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Paper Abstract

We describe the ground testing and characterization of the Multiband Imaging Photometer for SIRTF (MIPS). This instrument is a camera with three focal plane arrays covering broad spectral bands centered at 24 μm, 70 μm, and 160 μm. The instrument features a variety of operation modes that permit accurate photometry, diffraction-limited imaging, efficient mapping, and low resolution spectral energy distribution determinations. The observational philosophy of MIPS relies heavily on the frequent use of internal relative calibration sources as well as a high level of redundancy in the data collection. We show that by using this approach, users of MIPS can expect very sensitive, highly repeatable observations of astronomical sources. The ground characterization program for MIPS involved a number of facilities including test dewars for focal-plane level testing, a specialized cryostat for instrument-level testing, and tests in the flight SIRTF Cryo-Telescope Assembly

Paper Details

Date Published: 5 March 2003
PDF: 10 pages
Proc. SPIE 4850, IR Space Telescopes and Instruments, (5 March 2003); doi: 10.1117/12.461593
Show Author Affiliations
Erick T. Young, Steward Observatory/Univ. of Arizona (United States)
George H. Rieke, Steward Observatory/Univ. of Arizona (United States)
James Cadien, Steward Observatory/Univ. of Arizona (United States)
Herve A. Dole, Steward Observatory/Univ. of Arizona (United States)
Charles W. Englebracht, Steward Observatory/Univ. of Arizona (United States)
Karl D. Gordon, Steward Observatory/Univ. of Arizona (United States)
Gerald B. Heim, Ball Aerospace & Technologies Corp. (United States)
Douglas M. Kelly, Steward Observatory/Univ. of Arizona (United States)
John A. Stansberry, Steward Observatory/Univ. of Arizona (United States)


Published in SPIE Proceedings Vol. 4850:
IR Space Telescopes and Instruments
John C. Mather, Editor(s)

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