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Proceedings Paper

Probing the phase transition of Mo/Au TES microcalorimeters
Author(s): Mark A. Lindeman; Simon R. Bandler; Regis P. Brekosky; James A. Chervenak; Enectali Figueroa-Feliciano; Fred M. Finkbeiner; Massimiliano Galeazzi; Mary J. Li; Caroline Kilbourn Stahle
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Paper Abstract

We present recent measurements obtained using a new method for characterizing transition edge sensor (TES) calorimeters: We measured the electrical impedance of a TES calorimeter throughout the superconducting to normal metal phase transition. The impedance method enables us to previously measure how the resistance and heat capacity of the TES varied throughout the phase transition. These measurements probe the internal state of oru Mo/Au TES. We also present recent results from measurements of noise in our TESs. Our measurements are instrumental toward understanding and optimizing our TES calorimeters.

Paper Details

Date Published: 11 March 2003
PDF: 8 pages
Proc. SPIE 4851, X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy, (11 March 2003); doi: 10.1117/12.461466
Show Author Affiliations
Mark A. Lindeman, NASA Goddard Space Flight Ctr. (United States)
Univ. of Maryland/College Park (United States)
Simon R. Bandler, NASA Goddard Space Flight Ctr. (United States)
Univ. of Maryland/College Park (United States)
Regis P. Brekosky, NASA Goddard Space Flight Ctr. (United States)
Swales Corp. (United States)
James A. Chervenak, NASA Goddard Space Flight Ctr. (United States)
Enectali Figueroa-Feliciano, NASA Goddard Space Flight Ctr. (United States)
Fred M. Finkbeiner, NASA Goddard Space Flight Ctr. (United States)
Swales Corp. (United States)
Massimiliano Galeazzi, NASA Goddard Space Flight Ctr. (United States)
Univ. of Miami (United States)
Mary J. Li, NASA Goddard Space Flight Ctr. (United States)
Raytheon ITSS (United States)
Caroline Kilbourn Stahle, NASA Goddard Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 4851:
X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy
Joachim E. Truemper; Harvey D. Tananbaum, Editor(s)

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