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Proceedings Paper

Active pixel sensors for imaging x-ray spectrometers
Author(s): Peter Holl; Peter Fischer; Robert Hartmann; Gunther Hasinger; Johannes Kollmer; Norbert Krause; Peter Lechner; Gerhard Lutz; Norbert Meidinger; Ivan Peric; Rainer H. Richter; Heike Soltau; Lothar Strueder; Johannes Treis; Joachim E. Truemper; Norbert Wermes
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Paper Abstract

Active Pixel Sensors (APS) offer high-resolution imaging in combination with a fast and flexible readout. The MPI Halbleiterlabor develops and produces DEPFET (Depleted Field Effect Transistor) based APS devices. They are additionally characterized by enhanced sensitivity for X-ray photons in the range from 0.1 keV to 25 keV, spectroscopic energy resolution (below 1 electron r.m.s.) and radiation hardness. Moreover, the production process on high-ohmic silicon allows incorporating additional high-speed spectrometers based on silicon drift detectors. Such a detector system is proposed as a wide field imager for the XEUS (X-ray Evolving Universe Spectroscopy) mission. XEUS is a planned project within the European Space Agency's Horizon 2000+ program. We will present a focal plane concept for XEUS and measurement results from DEPFET-APS prototypes and high speed drift detectors.

Paper Details

Date Published: 11 March 2003
PDF: 9 pages
Proc. SPIE 4851, X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy, (11 March 2003); doi: 10.1117/12.461356
Show Author Affiliations
Peter Holl, PNSensor GmbH (Germany)
Peter Fischer, Univ. Bonn (Germany)
Robert Hartmann, PNSensor GmbH (Germany)
Gunther Hasinger, Max-Planck-Institut fuer extraterrestrische Physik (Germany)
Johannes Kollmer, Max-Planck-Institut fuer extraterrestrische Physik (Germany)
Norbert Krause, Max-Planck-Institut fuer extraterrestrische Physik (Australia)
Peter Lechner, PNSensor GmbH (Germany)
Gerhard Lutz, Max-Planck-Institut fuer Physik (Germany)
Norbert Meidinger, Max-Planck-Institut fuer extraterrestrische Physik (Germany)
Ivan Peric, Univ. Bonn (Germany)
Rainer H. Richter, Max-Planck-Institut fuer Physik (Germany)
Heike Soltau, PNSensor GmbH (Germany)
Lothar Strueder, Max-Planck-Institut fuer extraterrestrische Physik (Germany)
Johannes Treis, Max-Planck-Institut fuer Physik (Germany)
Joachim E. Truemper, Max-Planck-Institut fuer extraterrestrische Physik (Germany)
Norbert Wermes, Univ. Bonn (Germany)

Published in SPIE Proceedings Vol. 4851:
X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy
Joachim E. Truemper; Harvey D. Tananbaum, Editor(s)

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