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Proceedings Paper

W/SiC x-ray multilayers optimized for use above 100 keV
Author(s): David L. Windt; Soizik Donguy; Charles J. Hailey; Jason Koglin; Veijo Honkimaki; Eric Ziegler; Finn Erland Christensen; C. M. Hubert Chen; Fiona A. Harrison; William W. Craig
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Paper Abstract

We have developed a new depth-graded multilayer system comprising W and SiC layers, suitable for use as hard X-ray reflective coatings operating in the energy range 100 - 200 keV. Grazing incidence X-ray reflectance at E=8 keV was used to characterize the interface widths, as well as the temporal and thermal stability in both periodic and depth-graded W/SiC structures, while synchrotron radiation was used to measure the hard X-ray reflectance of a depth-graded multilayer designed specifically for use in the range E~150 - 170 keV. We have modeled the hard X-ray reflectance using newly-derived optical constants, which we determined from reflectance-vs-incidence angle measurements also made using synchrotron radiation, in the range E=120 - 180 keV. We describe our experimental investigation in detail, compare the new W/SiC multilayers with both W/Si and W/B4C films that have been studied previously, and discuss the significance of these results with regard to the eventual development of a hard X-ray nuclear line telescope.

Paper Details

Date Published: 11 March 2003
PDF: 8 pages
Proc. SPIE 4851, X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy, (11 March 2003); doi: 10.1117/12.461303
Show Author Affiliations
David L. Windt, Columbia Astrophysics Lab. (United States)
Soizik Donguy, Columbia Astrophysics Lab. (United States)
Charles J. Hailey, Columbia Astrophysics Lab. (United States)
Jason Koglin, Columbia Astrophysics Lab. (United States)
Veijo Honkimaki, European Synchrotron Radiation Facility (France)
Eric Ziegler, European Synchrotron Radiation Facility (France)
Finn Erland Christensen, Danish Space Research Institute (Denmark)
C. M. Hubert Chen, California Institute of Technology (United States)
Fiona A. Harrison, California Institute of Technology (United States)
William W. Craig, Lawrence Livermore National Lab. (United States)

Published in SPIE Proceedings Vol. 4851:
X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy
Joachim E. Truemper; Harvey D. Tananbaum, Editor(s)

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