Share Email Print
cover

Proceedings Paper

Diffraction-limited astronomical x-ray imaging and x-ray interferometry using normal-incidence multilayer optics
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We describe a new technical approach for observations of Galactic and extra-Galactic soft X-ray sources with ultra-high angular resolution. The technique is based on the use of recently developed diffraction-limited, normal-incidence mirror substrates and ultra-short-period multilayer coatings, tuned to specific bright emission lines in the range 16 < l < 40 Å, for the construction of a diffraction-limited X-ray telescope. Sub-milliarcsecond resolution could be achieved in a moderately-sized Cassegrain or prime-focus geometry, while resolution of order 0.01 microarcseconds could be achieved using a synthetic aperture X-ray interferometer constructed from an array of such telescopes spread over a 50 km baseline. We describe our technical approach in detail and outline some of the observations that would become possible with the proposed instrumentation.

Paper Details

Date Published: 11 March 2003
PDF: 10 pages
Proc. SPIE 4851, X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy, (11 March 2003); doi: 10.1117/12.461288
Show Author Affiliations
David L. Windt, Columbia Astrophysics Lab. (United States)
Steven M. Kahn, Columbia Astrophysics Lab. (United States)
Gary E. Sommargren, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 4851:
X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy
Joachim E. Truemper; Harvey D. Tananbaum, Editor(s)

© SPIE. Terms of Use
Back to Top