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Proceedings Paper

Monte Carlo methods for x-ray dispersive spectrometers
Author(s): John R. Peterson; J. Garrett Jernigan; Steven M. Kahn
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Paper Abstract

We discuss multivariate Monte Carlo methods appropriate for X-ray dispersive spectrometers. Dispersive spectrometers have many advantages for high resolution spectroscopy in the X-ray band. Analysis of data from these instruments is complicated by the fact that the instrument response functions are multi-dimensional and relatively few X-ray photons are detected from astrophysical sources. Monte Carlo methods are the natural solution to these challenges, but techniques for their use are not well developed. We describe a number of methods to produce a highly efficient and flexible multivariate Monte Carlo. These techniques include multi-dimensional response interpolation and multi-dimensional event comparison. We discuss how these methods have been extensively used in the XMM-Newton Reflection Grating Spectrometer in-flight calibration program. We also show several examples of a Monte Carlo applied to observations of clusters of galaxies and elliptical galaxies with the XMM-Newton observatory.

Paper Details

Date Published: 19 December 2002
PDF: 12 pages
Proc. SPIE 4847, Astronomical Data Analysis II, (19 December 2002); doi: 10.1117/12.461030
Show Author Affiliations
John R. Peterson, Columbia Univ. (United States)
J. Garrett Jernigan, Univ. of California/Berkeley (United States)
Steven M. Kahn, Columbia Univ. (United States)

Published in SPIE Proceedings Vol. 4847:
Astronomical Data Analysis II
Jean-Luc Starck; Fionn D. Murtagh, Editor(s)

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