Share Email Print
cover

Proceedings Paper

Wide-field imaging interferometry testbed 3: metrology subsystem
Author(s): Douglas B. Leviton; Brad J. Frey; David T. Leisawitz; Anthony J. Martino; William L. Maynard; Lee G. Mundy; Stephen A. Rinehart; Stacy H. Teng; Xiaolei Zhang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In order for data products from WIIT to be as robust as possible, the alignment and mechanical positions of source, receiver, and detector components must be controlled and measured with extreme precision and accuracy, and the ambient environment must be monitored to allow environmental effects to be correlated with even small perturbations to fringe data. Relevant detailed anatomy of many testbed components and assemblies are described. The system of displacement measuring interferometers (DMI), optical encoders, optical alignment tools, optical power monitors, and temperature sensors implemented for control and monitoring of the testbed is presented.

Paper Details

Date Published: 26 February 2003
PDF: 12 pages
Proc. SPIE 4852, Interferometry in Space, (26 February 2003); doi: 10.1117/12.460948
Show Author Affiliations
Douglas B. Leviton, NASA Goddard Space Flight Ctr. (United States)
Brad J. Frey, NASA Goddard Space Flight Ctr. (United States)
David T. Leisawitz, NASA Goddard Space Flight Ctr. (United States)
Anthony J. Martino, NASA Goddard Space Flight Ctr. (United States)
William L. Maynard, NASA Goddard Space Flight Ctr. (United States)
Lee G. Mundy, Univ. of Maryland/College Park (United States)
Stephen A. Rinehart, National Research Council (United States)
Stacy H. Teng, Univ. of Maryland/College Park (United States)
Xiaolei Zhang, Science Systems and Applications Inc. (United States)


Published in SPIE Proceedings Vol. 4852:
Interferometry in Space
Michael Shao, Editor(s)

© SPIE. Terms of Use
Back to Top