Share Email Print
cover

Proceedings Paper

Passively Q-switched diode-pumped Yb:YAG laser using Cr4+ -doped garnets
Author(s): Yehoshua Y. Kalisky; Christophe Labbe; Karol Waichman; Leonid Kravchik; U. Rachum; Peizhen Deng; Jun Xu; Jun Dong; Wei Chen
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

We investigated the operation of a diode-pumped Yb:YAG laser passively Q-switched, by Cr4+:YAG, Cr4+:LuAG, and Cr4+:GSGG saturable absorbers. The results presented here are focused towards the design of a passively Q-switched Yb:YAG microlaser. The free-running performance of both rod and a disk Yb:YAG is characterized, and experimental parameters such as gain and loss are evaluated. These values, together with the value of the stimulated emission cross section, e.g. (sigma) emequals3.3x10-20 cm2 were found to fit between our experimental results and an existing numerical model which relates the experimental and physical parameters to the minimal threshold pumping power. Q-switched pulses with maximum peak power of approximately equals 10.4-kW, and energy of approximately equals 0.5 mJ/pulse were extracted with 30% extraction efficiency.

Paper Details

Date Published: 28 March 2002
PDF: 12 pages
Proc. SPIE 4628, Nonlinear Materials: Growth, Characterization, Devices, and Applications, (28 March 2002); doi: 10.1117/12.460816
Show Author Affiliations
Yehoshua Y. Kalisky, Arava Laser Lab. (Israel)
Christophe Labbe, Arava Laser Lab. (Israel)
Karol Waichman, Nuclear Research Ctr./Negev (Israel)
Leonid Kravchik, Arava Laser Lab. (Israel)
U. Rachum, Arava Laser Lab. (Israel)
Peizhen Deng, Shanghai Institute of Optics and Fine Mechanics (China)
Jun Xu, Shanghai Institute of Optics and Fine Mechanics (China)
Jun Dong, Shanghai Institute of Optics and Fine Mechanics (China)
Wei Chen, Shanghai Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 4628:
Nonlinear Materials: Growth, Characterization, Devices, and Applications
Dennis D. Lowenthal; Yehoshua Y. Kalisky, Editor(s)

© SPIE. Terms of Use
Back to Top