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Proceedings Paper

Diffraction hardware testbed and model validation
Author(s): David B. Schaechter; Patrick E. Perkins; Paul V. Mammini; David A. Swanson; Chris W. Tischhauser; Robert S. Benson; Torben B. Andersen; Richard S. Bruner; Richard I. Fowler; Kevin T. Morimoto; Lisa A. Sievers
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Paper Abstract

Optical systems, which operate over a wide range of Fresnel numbers, are often times performance-limited by diffraction effects. In order to characterize such effects at the 40-100 picometer level, a diffraction testbed has been built which has the capability of measuring diffraction effects at this level. Concurrently, mathematical diffraction modeling tools have been developed that propagate an input wavefront through an optical train, while retaining amplitude and phase information at a grid resolution sufficient for yielding picometer-resolution diffraction test data. This paper contains a description of this diffraction hardware testbed, the diffraction modeling approach, and a comparison of the modeled and hardware test results, which then serves as validation of the diffraction modeling methodology.

Paper Details

Date Published: 26 February 2003
PDF: 12 pages
Proc. SPIE 4852, Interferometry in Space, (26 February 2003); doi: 10.1117/12.460697
Show Author Affiliations
David B. Schaechter, Lockheed Martin Advanced Technology Ctr. (United States)
Patrick E. Perkins, Lockheed Martin Advanced Technology Ctr. (United States)
Paul V. Mammini, Lockheed Martin Advanced Technology Ctr. (United States)
David A. Swanson, Lockheed Martin Advanced Technology Ctr. (United States)
Chris W. Tischhauser, Lockheed Martin Advanced Technology Ctr. (United States)
Robert S. Benson, Lockheed Martin Advanced Technology Ctr. (United States)
Torben B. Andersen, Lockheed Martin Advanced Technology Ctr. (United States)
Richard S. Bruner, Lockheed Martin Advanced Technology Ctr. (United States)
Richard I. Fowler, Lockheed Martin Advanced Technology Ctr. (United States)
Kevin T. Morimoto, Lockheed Martin Advanced Technology Ctr. (United States)
Lisa A. Sievers, Jet Propulsion Lab. (United States)


Published in SPIE Proceedings Vol. 4852:
Interferometry in Space
Michael Shao, Editor(s)

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