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Proceedings Paper

Object digitalization using a scanning fringe projection system
Author(s): Michael Zacher; Ingo Krohne; Ulf Glaser; T. Pfeifer
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Paper Abstract

The advantage of optical 3D measurement systems like triangulation based fringe projection systems compared with tactile working systems is their contactless and fast 3D surface data acquisition. The results in the form of point clouds can be processed regarding a mathematical surface description for CAD data generation. In many cases the optical 3D surface data acquisition of complex workpieces cannot be achieved in one measuring process so that it is necessary to merge different measuring fields. This approach is essential when the object is larger than the measuring range or the object cannot be measured in one measuring process in consequence of reflections or shadings. According to these problems a fringe projection system was integrated in a coordinate measuring machine with 5 axes (3 linear axes and 2 rotation axes). By using these axes, every region of the workpiece can be reached with the optical 3D sensor for digitalization. To get the complete point cloud of the object surface the different measuring fields must be transformed in one coordinate system by using the relative axes positions of the coordinate measuring machine. Results concerning Reverse Engineering applications and considerations of the measurement uncertainty of the scanning fringe projection system are presented.

Paper Details

Date Published: 8 March 2002
PDF: 8 pages
Proc. SPIE 4661, Three-Dimensional Image Capture and Applications V, (8 March 2002); doi: 10.1117/12.460173
Show Author Affiliations
Michael Zacher, Fraunhofer Institut fuer Produktionstechnologie (Germany)
Ingo Krohne, Fraunhofer Institut fuer Produktionstechnologie (Germany)
Ulf Glaser, Fraunhofer Institut fuer Produktionstechnologie (Germany)
T. Pfeifer, Fraunhofer Institut fuer Produktionstechnologie (Germany)

Published in SPIE Proceedings Vol. 4661:
Three-Dimensional Image Capture and Applications V
Brian D. Corner; Roy P. Pargas; Joseph H. Nurre, Editor(s)

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