Share Email Print
cover

Proceedings Paper

Single hot spot discharge in SF6 gas and in the mixture SF6/C2H6
Author(s): Yu. Bychkov; S. Gortchakov; Bernard Lacour; S. Pasquiers; C. Postel; Vincent Puech; Arkadi G. Yastremsky
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Dynamics of development of single hot spot discharge in SF6 gas and in the mixture SF6/C2H6 and of its contraction has been studied experimentally. Visualization of discharge development has been performed by a fast shutter CCD camera. Discharge properties have been studied in a wide range of current densities and input energies. It has been found that a single hot spot discharge has a cup- like structure. The diameter of the cathode hot spot is 0.04 cm, while the diameter of the plasma near the anode reach a value of about 3 cm. An increase of the discharge current causes an enlargement of the discharge cross section. The hypothesis of discharge widening is presented and discussed. It has been shown that discharges in the mixture are more homogeneous and stable. Single hot spot allows to realize a discharge current of 2 - 3 kA at input energies of about 1 - 3 J without distortion of discharge homogeneity. When the discharge with three hot spots separated by 5 mm has been investigated, the formation of inhomogeneity from one hot spot occurs at 700 A. Development of a channel with enhanced conductivity from single hot spot in SF6 gas has been also obtained experimentally in case with advanced preionization.

Paper Details

Date Published: 26 March 2002
PDF: 10 pages
Proc. SPIE 4747, International Conference on Atomic and Molecular Pulsed Lasers IV, (26 March 2002); doi: 10.1117/12.460131
Show Author Affiliations
Yu. Bychkov, Institute of High Current Electronics (Russia)
S. Gortchakov, Institute of High Current Electronics (Russia)
Bernard Lacour, Univ. Paris-Sud (France)
S. Pasquiers, Univ. Paris-Sud (France)
C. Postel, Univ. Paris-Sud (France)
Vincent Puech, Univ. Paris-Sud (France)
Arkadi G. Yastremsky, Institute of High Current Electronics (Russia)


Published in SPIE Proceedings Vol. 4747:
International Conference on Atomic and Molecular Pulsed Lasers IV

© SPIE. Terms of Use
Back to Top