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Proceedings Paper

Analysis of a chemical method to increase extreme-ultraviolet microchannel-plate quantum efficiency
Author(s): Richelieu Hemphill; Jerry Edelstein
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Paper Abstract

Physical surface changes due to a wet chemical method to increase the extreme ultraviolet (EUV) quantum detection efficiency (QDE) of microchannel plate (MCP) detectors is examined. We show evidence that enhanced channel surface roughness and the creation of a low density surface layer combine to increase the secondary electron emission coefficient, which inturn, increases the quantum detection efficiency of the input MCP. The use of the wet chemical method to enhance the MCP EUV QDE by five different space flight programs is also discussed.

Paper Details

Date Published: 24 February 2003
PDF: 6 pages
Proc. SPIE 4854, Future EUV/UV and Visible Space Astrophysics Missions and Instrumentation, (24 February 2003); doi: 10.1117/12.459778
Show Author Affiliations
Richelieu Hemphill, Space Sciences Lab./Univ. of California/Berkeley (United States)
Jerry Edelstein, Space Sciences Lab./Univ. of California/Berkeley (United States)


Published in SPIE Proceedings Vol. 4854:
Future EUV/UV and Visible Space Astrophysics Missions and Instrumentation
J. Chris Blades; Oswald H. W. Siegmund, Editor(s)

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