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Proceedings Paper

Z-Spec: a broadband direct-detection millimeter-wave spectrometer
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Paper Abstract

Z-Spec is a broadband (195 - 310 GHz), direct-detection, millimeter-wave spectrometer with moderate resolution (R ~ 350) that we are building to observe CO rotational lines and atomic fine-structure lines in the recently discovered population of submillimeter galaxies. A large fraction of these sources cannot be identified optically and thus redshift determination is extremely difficult. The large instantaneous bandwidth of Z-Spec will allow measurement of redshifts up to z~4 via detection of two or more CO lines in a single spectrum. The spectrometer is based on a parallel-plate waveguide grating architecture that is substantially more compact than a conventional free-space grating system. The spectrometer and an array of 160 silicon nitride micromesh bolometers will be cooled to 100 mK to provide background-limited sensitivity. In addition to measuring the redshifts of sources discovered in submillimeter continuum surveys, Z-Spec will demonstrate a novel spectrometer concept well-suited for future far-infrared space missions.

Paper Details

Date Published: 17 February 2003
PDF: 10 pages
Proc. SPIE 4855, Millimeter and Submillimeter Detectors for Astronomy, (17 February 2003); doi: 10.1117/12.459419
Show Author Affiliations
Bret J. Naylor, California Institute of Technology (United States)
Peter A. R. Ade, Univ. of Wales/Cardiff (United Kingdom)
James J. Bock, Jet Propulsion Lab. (United States)
Charles M. Bradford, California Institute of Technology (United States)
Mark Dragovan, Jet Propulsion Lab. (United States)
Lionel Duband, CEA/SBT (France)
Lieko Earle, Univ. of Colorado/Boulder (United States)
Jason Glenn, Univ. of Colorado/Boulder (United States)
Hideo Matsuhara, Institute of Space and Astronautical Science (Japan)
Hien Nguyen, Jet Propulsion Lab. (United States)
Minhee Yun, Jet Propulsion Lab. (United States)
Jonas Zmuidzinas, California Institute of Technology (United States)


Published in SPIE Proceedings Vol. 4855:
Millimeter and Submillimeter Detectors for Astronomy
Thomas G. Phillips; Jonas Zmuidzinas, Editor(s)

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