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Proceedings Paper

Optimization of quadrilayer structures for various magneto-optical recording materials
Author(s): Ping He; William A. McGahan; John A. Woollam
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Paper Abstract

Computer simulation of magneto-optical responses as a function of wavelength (3000-8000 angstrom), thicknesses, and material were made, based on the scattering matrix formulation for the calculation of optical and magneto-optical response of multilayer systems. Results from the following MO materials systems are presented: TbFeCo and Co/Pt multilayer. Silicon nitride and silicon nitride and silicon dioxide were the dielectrics used in the simulations, and aluminum was assumed for the reflector. The optimum structure for each of these materials systems has been found. The Kerr rotation, reflectance, and figures of merit for recording were calculated.

Paper Details

Date Published: 1 July 1991
PDF: 11 pages
Proc. SPIE 1499, Optical Data Storage '91, (1 July 1991); doi: 10.1117/12.45939
Show Author Affiliations
Ping He, Univ. of Nebraska/Lincoln (United States)
William A. McGahan, Univ. of Nebraska/Lincoln (United States)
John A. Woollam, Univ. of Nebraska/Lincoln (United States)


Published in SPIE Proceedings Vol. 1499:
Optical Data Storage '91

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