Share Email Print

Proceedings Paper

Picometer-accuracy laser-metrology gauge for Keck interferometer differential-phase subsystem
Author(s): Yekta Gursel
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Keck Interferometer differential-phase planet-detection system requires a picometer accuracy, large (2 μm to 4 μm) amplitude optical path-length modulator that can operate at fairly high frequencies (250 Hz, 750 Hz, and 1250 Hz, a partial, triangular wave motion). We have developed a gauge which monitors the amplitude of the motion of the path-length modulator and which is capable of reaching a sensitivity of at least 3 pm per sqrt(Hz) within a band width of 1 Hz at 250 Hz, 750 Hz, and 1250 Hz. Two of these gauges are built. The gauges are compared to each other while monitoring a common optical path-length modulator to determine their accuracy. In this paper, the gauge construction details, the results of the gauge accuracy tests as well as the final path-length modulator performance details are presented.

Paper Details

Date Published: 21 February 2003
PDF: 16 pages
Proc. SPIE 4838, Interferometry for Optical Astronomy II, (21 February 2003); doi: 10.1117/12.459329
Show Author Affiliations
Yekta Gursel, Jet Propulsion Lab. (United States)

Published in SPIE Proceedings Vol. 4838:
Interferometry for Optical Astronomy II
Wesley A. Traub, Editor(s)

© SPIE. Terms of Use
Back to Top