Share Email Print
cover

Proceedings Paper

Broadly tunable continuous-wave solid state red source based on intracavity-doubled Cr4+:forsterite laser
Author(s): Alphan Sennaroglu
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This work describes the development and characterization of a continuous-wave (cw) room-temperature intracavity-doubled Cr4+:forsterite laser which produces broadly tunable red radiation. Such a source is potentially important in spectroscopy, display technologies, and medical applications. In the experiments, a 2-cm-long Cr4+:forsterite crystal was placed in an astigmatically compensated x-cavity which was end-pumped by a 1064-nm Nd:YAG laser. The crystal which had a small-signal pump absorption of 68 percent was maintained at 20 degrees C. An intracavity Brewster-cut SF10 prism was used to tune the output of the laser. Intracavity frequency doubling was achieved by using a periodically poled lithium niobate (PPLN) crystal which had 8 different poling periods. The PPLN crystal was placed inside the resonator between a curved folding mirror and the curved output coupler. The transmission of the output coupler was 2.6 percent at 1260 nm. The PPLN temperature was maintained at 188 degrees C. By translating the PPLN crystal through sections with different poling periods, second harmonic generation was obtained in the wavelength region between 613 and 655 nm. With an incident pump power of 6.8 W at 1064 nm, the Cr4+:forsterite laser produced 245 mW of cw output power at 1260 nm and intracavity frequency doubling yielded 45 mW at 630 nm.

Paper Details

Date Published: 13 March 2002
PDF: 8 pages
Proc. SPIE 4630, Solid State Lasers XI, (13 March 2002); doi: 10.1117/12.458997
Show Author Affiliations
Alphan Sennaroglu, Koc Univ. (Turkey)


Published in SPIE Proceedings Vol. 4630:
Solid State Lasers XI
Richard Scheps, Editor(s)

© SPIE. Terms of Use
Back to Top