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Proceedings Paper

Spectral hole-burning of rare-earth ions doped in AL2O3-SiO2 glass
Author(s): Masayuki Nogami; Kazuhiro Suzuki
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Paper Abstract

Al2O3-SiO2 glasses doped with Sm3+ ions were prepared using sol-gel method, in which the Sm3+ ions were reduced into Sm2+ by heaing in H2-gas or irradiating with x-ray. When heated in H2 gas, the H2 molecules react with oxygen ions to form H2O. Removal of the generated H2O causes the number of oxygen ions surrounding Sm3+ to decrease, resulting into the resuction of the Sm3+ ions. in contrast, in the x-ray irradiated glass, it is concluded that the Sm3+ ions are reduced into Sm2+ by electron transfer from the oxygen defect center. The hole defect centers are trapped in oxygen ions boound with Al3+ ions. The spectral hole burning of the x-ray irradiated glasses could be burned by the reverse reaction of the reduction of Sm3+ ions, that is, the electron transfer from the excited Sm2+ into the surrounding oxygen. A short distance between the Sm2+ and oxygen defect centers brings fast hole burning. On the other hand, the hole burning in the H2-treated glasses was performed by the electron transfer between the Sm2+ and the trapping center such as Sm3+.

Paper Details

Date Published: 23 October 2002
PDF: 6 pages
Proc. SPIE 4804, Sol-Gel Optics VI, (23 October 2002); doi: 10.1117/12.458829
Show Author Affiliations
Masayuki Nogami, Nagoya Institute of Technology (Japan)
Kazuhiro Suzuki, Nagoya Institute of Technology (Japan)

Published in SPIE Proceedings Vol. 4804:
Sol-Gel Optics VI
Edward J. A. Pope; Helmut K. Schmidt; Bruce S. Dunn; Shuichi Shibata, Editor(s)

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