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Proceedings Paper

Fast simulation of atomic-force-microscope imaging of atomic and polygonal surfaces using graphics hardware
Author(s): Gokul Varadhan; Warren Robinett; Dorothy Erie; Russell M. Taylor
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Paper Abstract

We present a fast method for computing simulated Atomic Force Microscope (AFM) image scans (including tip artifacts). The basic insight is that the array of depth values in the depth buffer of a graphics system is analogous to the height field making up an AFM image, and thus the ability of graphics hardware to compute the depth of many pixels in parallel can be used to radically speed up the AFM imaging simulation. We also present a method for reconstructing better approximations to the true shape from AFM images distorted by tip artifacts. These algorithms are implemented using operations from 3D grayscale mathematical morphology operations of dilation and erosion.

Paper Details

Date Published: 12 March 2002
PDF: 9 pages
Proc. SPIE 4665, Visualization and Data Analysis 2002, (12 March 2002); doi: 10.1117/12.458778
Show Author Affiliations
Gokul Varadhan, Univ. of North Carolina/Chapel Hill (United States)
Warren Robinett, Univ. of North Carolina/Chapel Hill (United States)
Dorothy Erie, Univ. of North Carolina/Chapel Hill (United States)
Russell M. Taylor, Univ. of North Carolina/Chapel Hill (United States)


Published in SPIE Proceedings Vol. 4665:
Visualization and Data Analysis 2002
Robert F. Erbacher; Philip C. Chen; Matti Groehn; Jonathan C. Roberts; Craig M. Wittenbrink, Editor(s)

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