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Proceedings Paper

Sine wave measurements of SPRITE detector MTF
Author(s): Kenneth J. Barnard; Glenn D. Boreman; Allen E. Plogstedt; Barry K. Anderson
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Paper Abstract

A method is presented for measuring the modulation transfer function of SPRITE detectors with a HgCdTe composition optimized for the 3-5 micron band. This method incorporates a 3.39-micron HeNe laser to generate Young's fringes of varying spatial frequency, which are scanned across the detector elements. The results are consistent with theoretical models for these devices and indicate a limited resolution capability for SPRITEs used for the 3-5 micron band.

Paper Details

Date Published: 1 September 1991
PDF: 6 pages
Proc. SPIE 1488, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing II, (1 September 1991); doi: 10.1117/12.45823
Show Author Affiliations
Kenneth J. Barnard, CREOL/Univ. of Central Florida (United States)
Glenn D. Boreman, CREOL/Univ. of Central Florida (United States)
Allen E. Plogstedt, McDonnell Douglas Electronic Systems Co. (United States)
Barry K. Anderson, McDonnell Douglas Electronic Systems Co. (United States)


Published in SPIE Proceedings Vol. 1488:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing II
Gerald C. Holst, Editor(s)

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