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Proceedings Paper

SPRITE detector characterization through impulse response testing
Author(s): Barry K. Anderson; Glenn D. Boreman; Kenneth J. Barnard; Allen E. Plogstedt
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Paper Abstract

An impulse response test and data evaluation method for characterizing a SPRITE detector capable of determining carrier lifetime, ambipolar mobility, carrier drift velocity variation, and detector limits is presented. The data obtained with the method can be used to optimize imaging system performance or to tailor future detectors from the same material lot. Results for a 3-5 micron detector bar, 650 microns long with a 62.5 microns horn geometry readout are reported.

Paper Details

Date Published: 1 September 1991
PDF: 10 pages
Proc. SPIE 1488, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing II, (1 September 1991); doi: 10.1117/12.45822
Show Author Affiliations
Barry K. Anderson, McDonnell Douglas Electronic Systems Co. (United States)
Glenn D. Boreman, CREOL/Univ. of Central Florida (United States)
Kenneth J. Barnard, CREOL/Univ. of Central Florida (United States)
Allen E. Plogstedt, McDonnell Douglas Electronic Systems Co. (United States)


Published in SPIE Proceedings Vol. 1488:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing II
Gerald C. Holst, Editor(s)

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