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Proceedings Paper

High-S/N high-resolution image slicer observations with UVES
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Paper Abstract

UVES is the UV-Visual high-resolution Echelle Spectrograph mounted at the 8-m Kueyen (UT2) telescope of the ESO VLT. In order to allow use of UVES at its highest resolution of up to 110 000, also during non-optimal seeing conditions, the instrument is equipped with Bowen-Walraven type image slicers. These devices have exit slits of 0.3, 0.44 and 0.68 arcseconds and possibility to view the sky next to the slicer for sky subtraction. This paper addresses the relevant UVES optical design aspects, image slicer design and manufacturing, observing procedures and usage statistics. In the last part of the paper we give examples of high-S/N observations made with the 0.3 arcsecond image slicer.

Paper Details

Date Published: 30 January 2003
PDF: 12 pages
Proc. SPIE 4842, Specialized Optical Developments in Astronomy, (30 January 2003); doi: 10.1117/12.458070
Show Author Affiliations
Hans Dekker, European Southern Observatory (Chile)
Poul E. Nissen, Univ. of Aarhus (Denmark)
Andreas Kaufer, European Southern Observatory (Chile)
Francesca Primas, European Southern Observatory (Germany)
Sandro D'Odorico, European Southern Observatory (Germany)
Reinhard W. Hanuschik, European Southern Observatory (Germany)

Published in SPIE Proceedings Vol. 4842:
Specialized Optical Developments in Astronomy
Eli Atad-Ettedgui; Sandro D'Odorico, Editor(s)

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