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Proceedings Paper

Biased percolation approach to failure propagation in nanostructures and prediction of the total failure by electronic noise analysis
Author(s): Laszlo B. Kish; Cecilia Penetta; Zoltan Gingl
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Paper Abstract

The analysis of electronic noise has the potential to predict forthcoming catastrophic failure of electronic devices and integrated circuits. This has a particularly important potential in submicron and nanoelectronics.

Paper Details

Date Published: 4 November 2002
PDF: 5 pages
Proc. SPIE 4809, Nanoscale Optics and Applications, (4 November 2002); doi: 10.1117/12.457548
Show Author Affiliations
Laszlo B. Kish, Texas A&M Univ. (United States)
Cecilia Penetta, Univ. of Lecce (Italy)
Zoltan Gingl, Attila Jozsef Univ. (Hungary)

Published in SPIE Proceedings Vol. 4809:
Nanoscale Optics and Applications
Guozhong Cao; Wiley P. Kirk, Editor(s)

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