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Proceedings Paper

Toward nanometer accuracy laser metrology for phase-referenced interferometry with the VLTI
Author(s): Samuel A. Leveque; Rainer Wilhelm; Yves Salvade; Olivier Scherler; Rene Daendliker
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Paper Abstract

The PRIMA laser metrology system is being developed to monitor optical path differences and optical path fluctuations encountered by two stellar objects inside the VLTI during phased-referenced observations. This system, which will operate at the scale of the VLTI, has an accuracy goal of a few nanometers. After an introduction to its design, based on heterodyne interferometry, this paper presents the results of sub-system characterization and prototyping as well as experimental results obtained during full-scale testing at the Paranal Observatory.

Paper Details

Date Published: 21 February 2003
PDF: 12 pages
Proc. SPIE 4838, Interferometry for Optical Astronomy II, (21 February 2003); doi: 10.1117/12.457173
Show Author Affiliations
Samuel A. Leveque, European Southern Observatory (Germany)
Rainer Wilhelm, European Southern Observatory (Germany)
Yves Salvade, Institute of Microtechnology/Univ. de Neuchatel (Switzerland)
Olivier Scherler, Institute of Microtechnology/Univ. de Neuchatel (Switzerland)
Rene Daendliker, Institute of Microtechnology/Univ. de Neuchatel (Switzerland)

Published in SPIE Proceedings Vol. 4838:
Interferometry for Optical Astronomy II
Wesley A. Traub, Editor(s)

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