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Proceedings Paper

Ritchey-Common test used for measurement of astronomical optic
Author(s): Sen Han; Erik Novak; Mike Schurig
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Paper Abstract

The Ritchey-Common test is a well-known method for large flat measurements. This paper describes a straightforward implementation of the formulas, to allow accurate surface height calculation using relatively few separate measurements. Both Ritchey-Common test and direct measurement results are presented. In comparison of the two methods, the Ritchey-Common test is in good agreement with the direct measurement.

Paper Details

Date Published: 30 January 2003
PDF: 4 pages
Proc. SPIE 4842, Specialized Optical Developments in Astronomy, (30 January 2003); doi: 10.1117/12.457001
Show Author Affiliations
Sen Han, Veeco Metrology Group (United States)
Erik Novak, Veeco Metrology Group (United States)
Mike Schurig, Veeco Metrology Group (United States)

Published in SPIE Proceedings Vol. 4842:
Specialized Optical Developments in Astronomy
Eli Atad-Ettedgui; Sandro D'Odorico, Editor(s)

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