Share Email Print
cover

Proceedings Paper

MEMS-based sensor system for environmental monitoring
Author(s): James T. Daly; Edward A. Johnson; Nicholas Moelders; Mark P. McNeal; Martin U. Pralle; Anton C. Greenwald; William Ho; Irina Puscasu; Thomas George; Daniel S. Choi
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A new IR-based sensor technology is introduced for environmental monitoring of industrial pollutants (CO2, CO, NOx, etc.). The design concept exploits Si-based, thermally isolated suspended bridge structures. These devices, which function as both IR emitter and detector, are fabricated using MEMS-based processing methods. Photonic bandgap (PBG) modified surfaces enable narrow band IR emission for high chemical selectivity and sensitivity. Spectral tuning is accomplished by controlling symmetry and lattice spacing of the PBG structures. IR spectroscopic studies were used to characterize transmission, absorption and emission spectra in the 2 to 20 micrometers wavelength range. Device characterization studies measured drive and emission power, temperature uniformity, and black body detectivity. Gas detection was achieved using non-dispersive infrared (NDIR) spectroscopic techniques, whereby target gas species and concentrations were determined from comparison to referenced spectra. A sensor system employing the emitter/detector sensor-chip with gas cell and reflective optics is demonstrated and CO2 gas sensitivity limits are reported. A multi-channel microsensor-array is proposed for multigas (e.g., CO2, CO, and NOx, etc.) detection.

Paper Details

Date Published: 22 February 2002
PDF: 7 pages
Proc. SPIE 4576, Advanced Environmental Sensing Technology II, (22 February 2002); doi: 10.1117/12.456941
Show Author Affiliations
James T. Daly, Ion Optics, Inc. (United States)
Edward A. Johnson, Ion Optics, Inc. (United States)
Nicholas Moelders, Ion Optics, Inc. (United States)
Mark P. McNeal, Ion Optics, Inc. (United States)
Martin U. Pralle, Ion Optics, Inc. (United States)
Anton C. Greenwald, Ion Optics, Inc. (United States)
William Ho, Ion Optics, Inc. (United States)
Irina Puscasu, Ion Optics, Inc. (United States)
Thomas George, Jet Propulsion Lab. (United States)
Daniel S. Choi, Jet Propulsion Lab. (United States)


Published in SPIE Proceedings Vol. 4576:
Advanced Environmental Sensing Technology II
Tuan Vo-Dinh; Stephanus Buettgenbach, Editor(s)

© SPIE. Terms of Use
Back to Top