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Proceedings Paper

X-ray spectral measurements of the JMAR high-power laser-plasma source
Author(s): Robert R. Whitlock; Charles M. Dozier; Daniel A. Newman; I. C. Edmond Turcu; Celestino J. Gaeta; Kelly L. Cassidy; Michael F. Powers; Thomas Kleindolph; James H. Morris; Richard Alan Forber
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Paper Abstract

X-ray spectra of Cu plasmas at the focus of a four-beam, solid-state diode-pumped laser have been recorded. This laser-plasma X-ray source is being developed for JMAR's lithography systems aimed at high- performance semiconductor integrated circuits. The unique simultaneous overlay of the four sub-nanosecond laser beams at 300 Hertz produces a bright, point-plasma X-ray source. PIN diode measurements of the X-ray output indicate that the conversion efficiency (ratio of X-ray emission energy into 2π steradians to incident laser energy) was approximately 9 percent with average X-ray power yields of greater than 10 Watts. Spectra were recorded on calibrated Kodak DEF film in a curved-crystal spectrograph. A KAP crystal (2d = 26.6 Angstroms) was used to disperse the 900 eV to 3000 eV spectral energies onto the film. Preliminary examination of the films indicated the existence of Cu and Cu XX ionization states. Additional spectra as a function of laser input power were also recorded to investigate potential changes in X-ray yields. These films are currently being analyzed. The analysis of the spectra provide absolute line and continuum intensities, and total X-ray output in the measured spectral range.

Paper Details

Date Published: 23 October 2002
PDF: 7 pages
Proc. SPIE 4781, Advances in Laboratory-Based X-Ray Sources and Optics III, (23 October 2002); doi: 10.1117/12.456517
Show Author Affiliations
Robert R. Whitlock, Naval Research Lab. (United States)
Charles M. Dozier, Geo-Centers, Inc. (United States)
Daniel A. Newman, Geo-Centers, Inc. (United States)
I. C. Edmond Turcu, JMAR Research, Inc. (United States)
Celestino J. Gaeta, JMAR Research, Inc. (United States)
Kelly L. Cassidy, JMAR Research, Inc. (United States)
Michael F. Powers, JMAR Research, Inc. (United States)
Thomas Kleindolph, JMAR Research, Inc. (United States)
James H. Morris, JMAR Research, Inc. (United States)
Richard Alan Forber, JMAR Research, Inc. (United States)


Published in SPIE Proceedings Vol. 4781:
Advances in Laboratory-Based X-Ray Sources and Optics III
Ali M. Khounsary; Carolyn A. MacDonald, Editor(s)

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