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Proceedings Paper

Optical tools for high-throughput screening of abrasion resistance of combinatorial libraries of organic coatings
Author(s): Radislav A. Potyrailo; Bret J. Chisholm; Daniel R. Olson; Michael J. Brennan; Chris A. Molaison
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Paper Abstract

Design, validation, and implementation of an optical spectroscopic system for high-throughput analysis of combinatorially developed protective organic coatings are reported. Our approach replaces labor-intensive coating evaluation steps with an automated system that rapidly analyzes 8x6 arrays of coating elements that are deposited on a plastic substrate. Each coating element of the library is 10 mm in diameter and 2 to 5 micrometers thick. Performance of coatings is evaluated with respect to their resistance to wear abrasion because this parameter is one of the primary considerations in end-use applications. Upon testing, the organic coatings undergo changes that are impossible to quantitatively predict using existing knowledge. Coatings are abraded using industry-accepted abrasion test methods at single-or multiple-abrasion conditions, followed by high- throughput analysis of abrasion-induced light scatter. The developed automated system is optimized for the analysis of diffusively scattered light that corresponds to 0 to 30% haze. System precision of 0.1 to 2.5% relative standard deviation provides capability for the reliable ranking of coatings performance. While the system was implemented for high-throughput screening of combinatorially developed organic protective coatings for automotive applications, it can be applied to a variety of other applications where materials ranking can be achieved using optical spectroscopic tools.

Paper Details

Date Published: 14 February 2002
PDF: 8 pages
Proc. SPIE 4578, Fiber Optic Sensor Technology and Applications 2001, (14 February 2002); doi: 10.1117/12.456105
Show Author Affiliations
Radislav A. Potyrailo, GE Corporate Research and Development Ctr. (United States)
Bret J. Chisholm, GE Corporate Research and Development Ctr. (United States)
Daniel R. Olson, GE Corporate Research and Development Ctr. (United States)
Michael J. Brennan, GE Corporate Research and Development Ctr. (United States)
Chris A. Molaison, GE Corporate Research and Development Ctr. (United States)


Published in SPIE Proceedings Vol. 4578:
Fiber Optic Sensor Technology and Applications 2001
Michael A. Marcus; Brian Culshaw, Editor(s)

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