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Proceedings Paper

Epitaxial Tl2Ba2CaCu2O8 thin films on LaAlO3 and their microwave device properties
Author(s): George V. Negrete; Robert B. Hammond
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Paper Abstract

Microwave data on epitaxial Tl2Ba2CaCu2O8 thin films grown on LaAlO3 substrates are reported. The authors fabricated and tested microstrip resonators using these films and performed measurements of the loss tangent of lanthanum aluminate substrates at 5 GHz and 77 K. Loss tangent values of 2 to 4X10-5 were measured. The authors extracted surface resistance for the superconducting thin films from unloaded Q measurements on microstrip resonators. They infer scaled surface resistance values of approximately 300 (mu) ohms at 10 GHz and 77 K from unloaded Q measurements at 5.6, 11.1, and 16.3 GHz. The measured surface resistances scale very closely with the square of the frequency.

Paper Details

Date Published: 1 July 1991
PDF: 9 pages
Proc. SPIE 1477, Superconductivity Applications for Infrared and Microwave Devices II, (1 July 1991); doi: 10.1117/12.45595
Show Author Affiliations
George V. Negrete, Superconductor Technologies Inc. (United States)
Robert B. Hammond, Superconductor Technologies Inc. (United States)

Published in SPIE Proceedings Vol. 1477:
Superconductivity Applications for Infrared and Microwave Devices II
Vernon O. Heinen; Kul B. Bhasin, Editor(s)

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