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Proceedings Paper

Optical cross-modulation method for diagnostic of powerful microwave radiation
Author(s): A. V. Kozar; S. A. Krupenko
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Paper Abstract

An electromagnetic-radiation diagnostics method is presented which is based on the interaction of intense microwave and laser infrared radiation with a semiconductor. Particular attention is given to the simultaneous effect of continuous microwave and optical infrared radiation on a crystalline silicon layer placed in a waveguide, the impact of this radiation on the mobility of free charge carriers and concentration of photocarriers, and an experimental method for studying the photocarrier diffusion caused by laser simulation of nonstationary microwave absorption in a semiconductor.

Paper Details

Date Published: 1 August 1991
PDF: 8 pages
Proc. SPIE 1476, Optical Technology for Microwave Applications V, (1 August 1991); doi: 10.1117/12.45585
Show Author Affiliations
A. V. Kozar, Moscow State Univ. (Russia)
S. A. Krupenko, Moscow State Univ. (Russia)

Published in SPIE Proceedings Vol. 1476:
Optical Technology for Microwave Applications V
Shi-Kay Yao, Editor(s)

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