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Proceedings Paper

X-VIEW: a high-resolution real-time solid state x-ray detection system
Author(s): Sylvie Chapuy; Zlatko Dimcovski; Harald Sperl; Marc Dimcovski; Caroline Valentin; Bruno Defer; Vincent Fridrici; Alain Nicolas; Leo Vincent; Jean Dorey
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Paper Abstract

The main goal of this paper is the optimization of X-View, a turn-key detection system for high resolution and real-time X-ray non-destructive testing. X-View consists of an microfocus X-ray generator and an acquisition detection system. Two large area detection systems have been developed based on amorphous (a-Si:H) and new CMOS technologies. The first one consists of an X-ray scintillator converter, arrays of amorphous silicon thin film transistors (TFT) and photodiodes (pitch down to 100 μm). The second one, based on CMOS technology, used in high resolution applications, consists of a scintillator and arrays of CMOS photodiodes (pitch of 50 μm). Both are equipped with a fast real-time electronic system for readout and digitization of images and appropriate computer tools for control, real-time image treatment data representation and off-line analysis. Images quality have been improved using a microfocus X-ray generator (focus of 50 μm). Decreasing the spot size of the generator improves the X-ray image quality. The geometric blurring is reduced, and object magnifications are possible. Our study presents the main characteristics of both detection systems (wide dynamic range, lack of blooming, high frame rate), quantitative and qualitative analysis X-ray inspection applications (electronics, various industries, medical, pharmaceutical, etc).

Paper Details

Date Published: 10 January 2003
PDF: 10 pages
Proc. SPIE 4784, X-Ray and Gamma-Ray Detectors and Applications IV, (10 January 2003); doi: 10.1117/12.455778
Show Author Affiliations
Sylvie Chapuy, BioScan SA (Switzerland)
Ecole Centrale de Lyon (France)
Zlatko Dimcovski, BioScan SA (Switzerland)
Ecole Centrale de Lyon (France)
Harald Sperl, BioScan SA (Switzerland)
Marc Dimcovski, BioScan SA (Switzerland)
Ecole Centrale de Lyon (France)
Caroline Valentin, BioScan SA (Switzerland)
Bruno Defer, Ecole Centrale de Lyon (France)
Vincent Fridrici, Ecole Centrale de Lyon (France)
Alain Nicolas, Ecole Centrale de Lyon (France)
Leo Vincent, Ecole Centrale de Lyon (France)
Jean Dorey, Ecole Centrale de Lyon (France)

Published in SPIE Proceedings Vol. 4784:
X-Ray and Gamma-Ray Detectors and Applications IV
Ralph B. James; Edwin M. Westbrook; Roger D. Durst; Larry A. Franks; Arnold Burger; Edwin M. Westbrook; Roger D. Durst, Editor(s)

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