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Proceedings Paper

Stress-Optic beam stabilization in free-space optics
Author(s): George A. Seaver
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Paper Abstract

Reliability is the main challenge facing Free Space Optical Communications today. Fog plays a key role here, but so does range and optical power throughput. Presently, the FSOC beam has a divergence in the milliradian range in order to compensate for beam wander caused by platform drift and vibrations and atmospheric index of refraction fluctuations. This large beam divergence limits the power throughput and the maximum range for communication. A beam that is collimated to the microradian level would greatly improve the power throughput (by three to four orders of magnitude) and thus, greatly improve the range, but this would also require a fast (> 1 kHz), accurate (microradiam) beam pointing system. Stress-Optics technology can provide that system. In Stress-Optics a stress field can be imposed on almost any optical material to modulate the index of refraction within that material in a predetermined manner. In general, stress can bring about a greater change in the index than can other fields that might be imposed. Stress-Optics accomplishes uniform beam steering in two dimensions to moderate angles, as well as beam shaping, including spherical and cylindrical lensing. The method is simple, solid-state, fast (< 5 mseconds), precise (< 1 microradian), inexpensive and durable. This patented Stress-Optic technique, when operated in conjunction with CMOS imaging feedback from a reference beam, can compensate for beam wander and defocusing from both platform and atmospheric sources. The stabilization is to microradian accuracy with kHz response times and milliradian 2-D collimation control.

Paper Details

Date Published: 6 December 2002
PDF: 9 pages
Proc. SPIE 4873, Optical Wireless Communications V, (6 December 2002); doi: 10.1117/12.455515
Show Author Affiliations
George A. Seaver, SeaLite Engineering, Inc. (United States)


Published in SPIE Proceedings Vol. 4873:
Optical Wireless Communications V
Eric J. Korevaar, Editor(s)

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