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Proceedings Paper

Parameterizing reconfigurable designs for image warping
Author(s): Jun Jiang; Stefan Schmidt; Wayne W.C. Luk; Daniel Rueckert
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Paper Abstract

This paper describes reconfigurable computing techniques for optimising image warping designs.Our image warping algorithm is based on radial basis functions, which enable the warping effect to be specified in terms of feature points. The coefficients of the warping function are obtained from the Symmetric Bipartite Table Method (SBTM), and the lookup tables can be generated dynamically at run time. We have deployed an optimised number representation involving both custom integer and custom floating-point formats in computing the radial function approximation. Furthermore, a fully-pipelined design has been developed in the Handel-C language, which can perform image warping in real time for resolutions up to 256 by 256 pixels on a Xilinx XC2V6000 device. This design is parameterisable at compile time for different image resolutions. Currently our implementation on a Xilinx Virtex XCV1000 device for the RC1000-PP platform achieves 50% faster than a software version on an AMD Athlon 1.4 GHz PC. A faster data bus and a larger FPGA for the RC1000-PP platform can result in a further speed improvement of over ten times.

Paper Details

Date Published: 2 July 2002
PDF: 12 pages
Proc. SPIE 4867, Reconfigurable Technology: FPGAs and Reconfigurable Processors for Computing and Communications IV, (2 July 2002); doi: 10.1117/12.455482
Show Author Affiliations
Jun Jiang, Imperial College of Science, Technology and Medicine (United Kingdom)
Stefan Schmidt, Imperial College of Science, Technology and Medicine (United Kingdom)
Wayne W.C. Luk, Imperial College of Science, Technology and Medicine (United Kingdom)
Daniel Rueckert, Imperial College of Science, Technology and Medicine (United Kingdom)


Published in SPIE Proceedings Vol. 4867:
Reconfigurable Technology: FPGAs and Reconfigurable Processors for Computing and Communications IV
John Schewel; Philip B. James-Roxby; Herman H. Schmit; John T. McHenry, Editor(s)

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