Share Email Print

Proceedings Paper

Simultaneous suppression of laser relative intensity noise: second- and third-order distortions using a balanced electro-absorption modulator
Author(s): Sagi Mathai; Federica Capelluti; Thomas Jung; Dalma Novak; Rod Waterhouse; Deborah L. Sivco; Alfred Y. Cho; Giovanni Ghione; Ming C. Wu
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Balanced electroabsorption modulators (B-EAM) are an attractive alternative to the cross-coupled Mach-Zehnder modulator. The B-EAM enables bias independent suppression of even-order distortions, relative intensity noise (RIN), and common amplified spontaneous emission noise. By biasing the B-EAM at the 3rd order null, a 5th order distortion limited spurious free dynamic range can be achieved. We report on the experimental demonstration of the simultaneous suppression of laser RIN, 2nd and 3rd order distortions using a 300 micrometers long B-EAM.

Paper Details

Date Published: 27 December 2001
PDF: 5 pages
Proc. SPIE 4490, Multifrequency Electronic/Photonic Devices and Systems for Dual-Use Applications, (27 December 2001); doi: 10.1117/12.455424
Show Author Affiliations
Sagi Mathai, Univ. of California/Los Angeles (United States)
Federica Capelluti, Politecnico di Torino (Italy)
Thomas Jung, Univ. of California/Los Angeles (United States)
Dalma Novak, Univ. of Melbourne (Australia)
Rod Waterhouse, RMIT Univ. (Australia)
Deborah L. Sivco, Lucent Technologies/Bell Labs. (United States)
Alfred Y. Cho, Lucent Technologies/Bell Labs. (United States)
Giovanni Ghione, Politecnico di Torino (Italy)
Ming C. Wu, Univ. of California/Los Angeles (United States)

Published in SPIE Proceedings Vol. 4490:
Multifrequency Electronic/Photonic Devices and Systems for Dual-Use Applications
Paul S. Idell; Andrew R. Pirich; Stanley R. Czyzak; Paul L. Repak; Paul S. Idell; Stanley R. Czyzak, Editor(s)

© SPIE. Terms of Use
Back to Top