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Proceedings Paper

Complete 3D model reconstruction from multiple views
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Paper Abstract

New algorithms are presented for automatically acquiring the complete 3D model of single and multiple objects using rotational stereo. The object is placed on a rotation stage. Stereo images for several viewing directions are taken by rotating the object by known angles. Partial 3D shapes and the corresponding texture maps are obtained using rotational stereo and shape from focus. First, for each view, shape from focus is used to obtain a rough 3D shape and the corresponding focused image. Then, the rough 3D shape and focused images are used in rotational stereo to obtain a more accurate measurement of 3D shape. The rotation axis is calibrated using three fixed points on a planar object and refined during surface integration. The complete 3D model is reconstructed by integrating partial 3D shapes and the corresponding texture maps of the object from multiple views. New algorithms for range image registration, surface integration and texture mapping are presented. Our method can generate 3D models very fast and preserve the texture of objects. A new prototype vision system named Stonybrook VIsion System 2 (SVIS-2) has been built and used in the experiments. In the experiments, 4 viewing directions at 90-degree intervals are used. SVIS-2 can acquire the 3D model of objects within a 250 mm x 250 mm x 250 mm cubic workspace placed about 750 mm from the camera. Both computational algorithms and experimental results on several objects are presented.

Paper Details

Date Published: 11 February 2002
PDF: 11 pages
Proc. SPIE 4567, Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II, (11 February 2002); doi: 10.1117/12.455263
Show Author Affiliations
Huei-Yung Lin, SUNY/Stony Brook (Taiwan)
Murali Subbarao, SUNY/Stony Brook (United States)
Soon-Yong Park, SUNY/Stony Brook (United States)


Published in SPIE Proceedings Vol. 4567:
Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II
Kevin G. Harding; John W. V. Miller, Editor(s)

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