Share Email Print
cover

Proceedings Paper

Scanning machine vision for fiber optic connector inspection
Author(s): Yair Kipman; David Wolin
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Traditional inspection methods for single-mode multi-fiber optical connectors include high magnification imaging equipment, which operate in stationary or stepper mode. The need for high precision combined with the requirement for increased throughput make these systems inefficient in the current production environment. Industry requirements are pushing towards better performance and yield as competition and pressure on the bottom line increase. A new approach, which incorporates a line-scan camera, combined with submicron-resolution optics and linear motion encoders, increases both the precision and the throughput in part inspection. Orifice morphology, as well as both relative and absolute position, can now be characterized with accuracy and repeatability measured in nanometers. Automation of batch processing for inspection enables 100% testing without impeding process cycle times. Connectors can be inspected both prior to assembly and after insertion of the fibers, allowing for part disposition further upstream in the production process. This paper will describe the line-scan-based machine vision inspection system, including considerations for image improvement through both hardware and software modifications. System capabilities and limitations will be discussed.

Paper Details

Date Published: 11 February 2002
PDF: 8 pages
Proc. SPIE 4567, Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II, (11 February 2002); doi: 10.1117/12.455259
Show Author Affiliations
Yair Kipman, ImageXpert Inc. (United States)
David Wolin, ImageXpert Inc. (United States)


Published in SPIE Proceedings Vol. 4567:
Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II
Kevin G. Harding; John W. V. Miller, Editor(s)

© SPIE. Terms of Use
Back to Top