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Proceedings Paper

Endpoint-finding algorithm for structured light metrology of large objects in cluttered environments
Author(s): Pierino G. Bonanni; Juan M. de Bedout
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Paper Abstract

Imaging of objects under linear structured-light illumination is commonly performed to ascertain location, dimensions, and morphology. The method is particularly attractive for prismatic objects distinguished by a single flat surface, because the processing algorithm can focus on purely linear features, and need only search for abrupt discontinuities in those features. In this paper, we consider a steel mill gantry crane application, wherein the targets to be localized are large steel slabs illuminated by laser line projectors, imaged from very close range to preserve spatial resolution. Conventional Radon transform- based methods for locating target edges yield highly ambiguous results, due to an abundance of image clutter coupled with the limited view of the overall object. This paper presents a modified Radon transform-based method for locating the target edges defined by the laser lines, and makes use of coarse a priori knowledge of the line pattern to resolve ambiguous edge points caused by neighboring clutter. A one-dimensional derivative of the Radon transform is used to improve the localization of short line segments. The algorithm is robust to the case in which the target object appears off axis and the clutter dominates the field of view.

Paper Details

Date Published: 11 February 2002
PDF: 9 pages
Proc. SPIE 4567, Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II, (11 February 2002); doi: 10.1117/12.455241
Show Author Affiliations
Pierino G. Bonanni, GE Corporate Research and Development Ctr. (United States)
Juan M. de Bedout, GE Corporate Research and Development Ctr. (United States)

Published in SPIE Proceedings Vol. 4567:
Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II
Kevin G. Harding; John W. V. Miller, Editor(s)

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