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Proceedings Paper

Surface profile measurement of specular objects by grating projection method
Author(s): Masayuki Yamamoto; Masahito Tonooka; Toru Yoshizawa
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Paper Abstract

This paper proposes a grating projection method to measure three-dimensional profile of specular objects. This method is principally available for any reflective objects without limitation of sizes. A deformed grating pattern is observed when the reference grating is projected onto a mirror-like surface of object. This deformed pattern reflected from the surface is captured with a CCE camera and analyzed to get three-dimensional profile of the specimen. Experimental results are shown with different samples.

Paper Details

Date Published: 11 February 2002
PDF: 8 pages
Proc. SPIE 4567, Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II, (11 February 2002); doi: 10.1117/12.455240
Show Author Affiliations
Masayuki Yamamoto, Tokyo Univ. of Agriculture and Technology (Japan)
Masahito Tonooka, Tokyo Univ. of Agriculture and Technology (Japan)
Toru Yoshizawa, Tokyo Univ. of Agriculture and Technology (Japan)


Published in SPIE Proceedings Vol. 4567:
Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II
Kevin G. Harding; John W. V. Miller, Editor(s)

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