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Proceedings Paper

Statistics for partially developed speckles: the impact on speckle-based measurements
Author(s): Steen Gruner Hanson; Rene Skov Hansen; Harold T. Yura
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Paper Abstract

The treatment of first- and second order intensity statistics of light scattered from surfaces not giving rise to fully developed speckles will be presented. Analytical expressions will be given for speckle size, first-order intensity moments and intensity variance within the framework of using the Huygens-Fresnel integral with the complete optical system included by the complex valued system ray ABCD-matrix. Various surface models will be presented, all being based on a Gaussian height distribution with various lateral length scale(s). For the sake of simplicity, only rotationally symmetric optical systems will be treated and no depolarization effects during scattering will be included.

Paper Details

Date Published: 5 February 2002
PDF: 14 pages
Proc. SPIE 4607, Selected Papers from Fifth International Conference on Correlation Optics, (5 February 2002); doi: 10.1117/12.455196
Show Author Affiliations
Steen Gruner Hanson, Risoe National Lab. (Denmark)
Rene Skov Hansen, Risoe National Lab. (Denmark)
Harold T. Yura, The Aerospace Corp. (United States)


Published in SPIE Proceedings Vol. 4607:
Selected Papers from Fifth International Conference on Correlation Optics

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