Share Email Print

Proceedings Paper

Improving the performance of the semiconductor panel used in millimeter and IR radar by shaping illuminating spot properties
Author(s): Mohammad H. Rahnavard; Aref Bakhtazad; Mehrdad Zomorrodi
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

An optical processing technique is introduced. This technique can improve the resolution of any scanning imaging system, that extract information by using the electronic behavior of materials. In this optical processing technique proper transparency, and adjusting the scanning light intensity are used. This technique can improve the performance of digital image enhancer. We implement our idea on a familiar millimeter image converter.

Paper Details

Date Published: 8 February 2002
PDF: 9 pages
Proc. SPIE 4486, Infrared Spaceborne Remote Sensing IX, (8 February 2002); doi: 10.1117/12.455109
Show Author Affiliations
Mohammad H. Rahnavard, Xerox Corp. (United States)
Aref Bakhtazad, Shiraz Univ. (Canada)
Mehrdad Zomorrodi, Xerox Corp. (United States)

Published in SPIE Proceedings Vol. 4486:
Infrared Spaceborne Remote Sensing IX
Marija Strojnik; Bjorn F. Andresen, Editor(s)

© SPIE. Terms of Use
Back to Top