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Proceedings Paper

Measurement of small birefringence in sapphire and quartz plates
Author(s): Dennis H. Goldstein; Lynn L. Deibler; Baoliang Bob Wang
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Paper Abstract

Birefringence in quartz and sapphire plates was measured at 632.8 nm. The observed birefringence is presumed to be caused by a tilt in the optic axis with respect to the plate geometry. Two instrumental methods were used to make the measurements. A Mueller matrix laser polarimeter was used at the Air Force Research Laboratory, and the Exicor system was used at Hinds. The measurement techniques are described and results are presented.

Paper Details

Date Published: 25 September 2002
PDF: 8 pages
Proc. SPIE 4819, Polarization Measurement, Analysis, and Applications V, (25 September 2002); doi: 10.1117/12.454834
Show Author Affiliations
Dennis H. Goldstein, Air Force Research Lab. (United States)
Lynn L. Deibler, Air Force Research Lab. (United States)
Baoliang Bob Wang, Hinds Instruments, Inc. (United States)


Published in SPIE Proceedings Vol. 4819:
Polarization Measurement, Analysis, and Applications V
Dennis H. Goldstein; David B. Chenault, Editor(s)

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