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Proceedings Paper

Customized CMOS wavefront sensor
Author(s): Davies W. de Lima Monteiro; Gleb V. Vdovin; J. Gerardo Rocha; Ventzeslav P. Iordanov; Mikhail Yu. Loktev; Pasqualina M. Sarro
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Paper Abstract

We report on an integrated Hartmann wavefront sensor (WFS) using passive-pixel architecture and pixels clustered as position-sensitive detectors for dynamic wavefront analysis. This approach substitutes a conventional imager, such as a CCD or CMOS imager, by a customized detector, thus improving the overall speed performance. CMOS (complementary-metal- oxide-semiconductor) technology enables on-chip integration of several analog and digital circuitry. The sensor performance depends on the feature size of the technology, noise levels, photosensitive elements employed, architecture chosen and reconstruction algorithm.

Paper Details

Date Published: 1 February 2002
PDF: 12 pages
Proc. SPIE 4493, High-Resolution Wavefront Control: Methods, Devices, and Applications III, (1 February 2002); doi: 10.1117/12.454699
Show Author Affiliations
Davies W. de Lima Monteiro, Delft Univ. of Technology (Netherlands)
Gleb V. Vdovin, Delft Univ. of Technology (Netherlands)
J. Gerardo Rocha, Univ. do Minho (Netherlands)
Ventzeslav P. Iordanov, Delft Univ. of Technology (Netherlands)
Mikhail Yu. Loktev, Delft Univ. of Technology (Netherlands)
Pasqualina M. Sarro, Delft Univ. of Technology (Netherlands)


Published in SPIE Proceedings Vol. 4493:
High-Resolution Wavefront Control: Methods, Devices, and Applications III
John D. Gonglewski; Mikhail A. Vorontsov; Mark T. Gruneisen, Editor(s)

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