Share Email Print

Proceedings Paper

Application of fused deposition modeling rapid prototyping system to the development of microchannels
Author(s): Hengzi Wang; Syed Masood; Pio Iovenitti; Erol C. Harvey
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Conventional methods of producing micro-scale components for BioMEMS applications such as microfluidic devices are limited to relatively simple geometries and are inefficient for prototype production. Rapid prototyping techniques may be applied to overcome these limitations. Fused Deposition Modelling is one such rapid prototyping process, which can build parts using layer by layer deposition technique with layers as low as 0.178 mm thick and using a select group of thermoplastic building materials. This paper presents the potential of Fused Deposition Modelling (FDM) system, available at IRIS, in building prototypes of scaled microchannels for experimental study and verification of fluid flow in microfluidic devices. The scope and application of FDM system as a powerful and flexible rapid prototyping device is described. Microchannels of different geometries are produced in ABS material on the FDM3000 rapid prototyping system and a methodology is presented for experimental study of the mixing of fluids in microchannels in conjunction with the theoretical analysis using FlumeCAD system.

Paper Details

Date Published: 19 November 2001
PDF: 8 pages
Proc. SPIE 4590, BioMEMS and Smart Nanostructures, (19 November 2001); doi: 10.1117/12.454606
Show Author Affiliations
Hengzi Wang, Swinburne Univ. of Technology (Australia)
Syed Masood, Swinburne Univ. of Technology (Australia)
Pio Iovenitti, Swinburne Univ. of Technology (Australia)
Erol C. Harvey, Swinburne Univ. of Technology (Australia)

Published in SPIE Proceedings Vol. 4590:
BioMEMS and Smart Nanostructures
Laszlo B. Kish; Erol C. Harvey; William B. Spillman Jr., Editor(s)

© SPIE. Terms of Use
Back to Top