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Proceedings Paper

Combined field [3-5 um] and [8-14 um] infrared imaging: approaches to extracting target's bidirectional reflectivity and emissivity
Author(s): Alain Malaplate; Francoise Nerry; Marc-Philippe Stoll; Bernard Guillame; Xavier Briottet
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Paper Abstract

Theoretical and experimental work has been conducted to assess the feasability of the retrieval of target's emissivity and bi-directional reflectivity from broadband infrared imaging systems. Focus was on the [3-5micrometers ] band II region where very little information is available. For accurate handling of the measured at-sensor radiance, account must be taken of target-to-sensor air layer, even for short distances, particularly in band II where atmospheric CO2 has a strong absorption band around 4.26 micrometers . It is shown that full integral expression over the spectral bandwidth of the instrument must be used and that usual factorization of contributions due to target, atmosphere and radiometer may lead to large errors when inverting the signal for emissivity or bi-directional reflectivity. Although retrieval of band II target's emissivity is, as a rule, extremely difficult outdoor conditions for natural surfaces, this work demonstrates that a multi-temporal regression method gives very good results with attainable accuracy on emissivity within 2%. Estimate of retrieving errors due to necessary approximations made in the formulation of the signal has been made via simulations. Experimental verification based on actual data acquired in outdoor conditions is in progress.

Paper Details

Date Published: 29 January 2002
PDF: 12 pages
Proc. SPIE 4538, Optics in Atmospheric Propagation and Adaptive Systems IV, (29 January 2002); doi: 10.1117/12.454407
Show Author Affiliations
Alain Malaplate, ONERA (France)
Francoise Nerry, CNRS (France)
Marc-Philippe Stoll, CNRS (France)
Bernard Guillame, ONERA (France)
Xavier Briottet, ONERA (France)


Published in SPIE Proceedings Vol. 4538:
Optics in Atmospheric Propagation and Adaptive Systems IV
Anton Kohnle; John D. Gonglewski; Thomas J. Schmugge, Editor(s)

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