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Proceedings Paper

Charge diffusion and loss as a function of absorption depth in x-ray CCD
Author(s): Makoto Kohno; Kensuke Imanishi; Aya Bamba; Masahiro Tsujimoto; Hiroshi Murakami; Takeshi G. Tsuru; Katsuji Koyama
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Paper Abstract

We study the relation between diffusion and loss of charge produced in X-ray CCDs with the fitting method. We obtain the extent and the pulse height of each X-ray event in a CCD by a two-dimensional image-fitting the charge distribution of the event. For the monochromatic X-rays, we find that the event with small extent keeps all the charge produced, while that with larger extent than a certain value loses some part of the produced charge as a function of extent. The result suggests that the event with a small extent is produced by an X-ray absorbed in the depletion layer. On the other hand, the event with large extent corresponds to an X-ray absorbed in the field-free region. We develop two new methods which enable us to derive the relation between the extent of an event and the absorption depth. One is performed by illuminating well calibrated monochromatic X-ray source. The other is realized by using with two monochromatic X-rays and enables us to measure the thickness of the CCD depletion layer without calibrating absolute flux of the monochromatic X-rays.

Paper Details

Date Published: 25 January 2002
PDF: 9 pages
Proc. SPIE 4497, X-Ray and Gamma-Ray Instrumentation for Astronomy XII, (25 January 2002); doi: 10.1117/12.454220
Show Author Affiliations
Makoto Kohno, Kyoto Univ. (Japan)
Kensuke Imanishi, Kyoto Univ. (Japan)
Aya Bamba, Kyoto Univ. (Japan)
Masahiro Tsujimoto, Kyoto Univ. (Japan)
Hiroshi Murakami, Kyoto Univ. (Japan)
Takeshi G. Tsuru, Kyoto Univ. (Japan)
Katsuji Koyama, Kyoto Univ. (Japan)


Published in SPIE Proceedings Vol. 4497:
X-Ray and Gamma-Ray Instrumentation for Astronomy XII
Kathryn A. Flanagan; Oswald H. W. Siegmund, Editor(s)

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