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Proceedings Paper

Spatial phase behavior in SAR images
Author(s): David Petit; Loic Soucille; Jean-Denis Durou; Frederic Adragna; Helene Oriot; Elisabeth Simonetto
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Paper Abstract

It is well known that a SAR image is composed of two types of information: amplitude and phase. Nevertheless, the information contained in the phase is hardly exploited on its own. Indeed, the number of processes at work and the scale difference between the image resolution and the wavelength induce, with regard to the phase, a quasi-random spatial behavior. However, our recent work shows that the phase of one image can be spatially correlated. First, we define an estimator for the spatial correlation of the phase, and study its behavior with real data. We assess the phase correlation according to the resolution and the type of surface. Then, we set down the theoretical bases of a statistical model of this behavior. We highlight the conditions required with regard to the resolution, the sampling rate, and the impulse response. We therefore identify the best kinds of surfaces, so that the phenomenon occurs. Hence, we simulate the phase correlation for different cases according to the phase model defined. We choose suitable parameters to the conditions of the real data and compare measurements and simulations. Finally, we propose possible applications related to the use of this new source of information.

Paper Details

Date Published: 28 January 2002
PDF: 11 pages
Proc. SPIE 4543, SAR Image Analysis, Modeling, and Techniques IV, (28 January 2002); doi: 10.1117/12.453977
Show Author Affiliations
David Petit, Institut de Recherche en Informatique de Toulouse (France)
Loic Soucille, Institut de Recherche en Informatique de Toulouse (France)
Jean-Denis Durou, Institut de Recherche en Informatique de Toulouse (France)
Frederic Adragna, Ctr. National d'Etudes Spatiales (France)
Helene Oriot, ONERA (France)
Elisabeth Simonetto, ONERA (France)


Published in SPIE Proceedings Vol. 4543:
SAR Image Analysis, Modeling, and Techniques IV
Francesco Posa, Editor(s)

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