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Proceedings Paper

Development of compound semiconductor detectors for x- and gamma-ray spectroscopy
Author(s): Alan Owens; Hans Andersson; Marcos Bavdaz; Christian Erd; Thomas Gagliardi; Vladimir Gostilo; N. Haack; Michael K. Krumrey; V. Lamsa; David H. Lumb; I. Lisjutin; I. Major; Seppo Arvo Anter Nenonen; Anthony J. Peacock; Heikki Sipila; Sergey Zatoloka
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Paper Abstract

We present laboratory results from our compound semiconductor program designed to produce X- and gamma-ray detectors with both high spectral and spatial resolution and with high quantum efficiencies over the energy range 1 to 500 keV. A number of materials are presently under study, including GaAs, InP, CdZnTe, HgI2 and TlBr. Extensive measurements on simple monolithic detectors and small format arrays have been carried out both in our laboratory and at the ESRF, HASYLAB and BESSY II synchrotron radiation facilities. The results have been used in conjunction with a material science program ultimately intended to produce near Fano limited, monolithic detectors and large area pixelated arrays for the next generation X-ray astrophysics and planetary space missions.

Paper Details

Date Published: 10 January 2003
PDF: 15 pages
Proc. SPIE 4784, X-Ray and Gamma-Ray Detectors and Applications IV, (10 January 2003); doi: 10.1117/12.453822
Show Author Affiliations
Alan Owens, European Space Agency/ESTEC (Netherlands)
Hans Andersson, Metorex International Oy (Finland)
Marcos Bavdaz, European Space Agency/ESTEC (Netherlands)
Christian Erd, European Space Agency/ESTEC (Netherlands)
Thomas Gagliardi, Metorex Inc. (United States)
Vladimir Gostilo, Baltic Scientific Instruments (Latvia)
N. Haack, HASYLAB/DESY (Germany)
Michael K. Krumrey, Physikalisch-Technische Bundesanstalt (Germany)
V. Lamsa, Metorex International Oy (Finland)
David H. Lumb, European Space Agency/ESTEC (Netherlands)
I. Lisjutin, Baltic Scientific Instruments (Latvia)
I. Major, Metorex Inc. (United States)
Seppo Arvo Anter Nenonen, Metorex International Oy (Finland)
Anthony J. Peacock, European Space Agency/ESTEC (Netherlands)
Heikki Sipila, Metorex International Oy (Finland)
Sergey Zatoloka, Baltic Scientific Instruments (Latvia)

Published in SPIE Proceedings Vol. 4784:
X-Ray and Gamma-Ray Detectors and Applications IV
Ralph B. James; Larry A. Franks; Arnold Burger; Edwin M. Westbrook; Roger D. Durst; Edwin M. Westbrook; Roger D. Durst, Editor(s)

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