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Proceedings Paper

Spectral signatures database for remote sensing applications
Author(s): Jeffrey G. Ruby; Robert L. Fischer
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Paper Abstract

A spectral signatures database (SSDB) has been developed to support the use of spectral sensing for remote sensing applications. A broad range of data from multiple regions of the electromagnetic spectrum is supported, including ultraviolet, visible, near-infrared, thermal infrared, and fluorescence. Future plans include support of hemispherical reflectance data. A priority in the database development was schema flexibility. Data can be archived with minimum or detailed sets of attributes. Pre-defined, community-standard attributes are included, but custom attributes may be added to meet the specific project or data requirements. The database incorporates all sources of signature data, including laboratory equipment, field radiometers, and imaging spectrometers. The database can also incorporate and reference other metadata such as project history, personnel information, spatial information, temporal information, equipment parameters, reference documents, photos, and imagery. The database was developed with entirely off-the-shelf products and exists in both stand-alone and web-based versions. Searching and filtering utilities have been included to allow a user to quickly locate and extract signatures of interest. Currently available application tools include two- and three-dimensional visualization, signature statistics, and surface matching and comparison. Data exporting is also available, which includes the creation of commercial image processing spectral libraries.

Paper Details

Date Published: 8 November 2002
PDF: 8 pages
Proc. SPIE 4816, Imaging Spectrometry VIII, (8 November 2002); doi: 10.1117/12.453793
Show Author Affiliations
Jeffrey G. Ruby, U.S. Army Engineer Research and Development Ctr. (United States)
Robert L. Fischer, U.S. Army Engineer Research and Development Ctr. (United States)

Published in SPIE Proceedings Vol. 4816:
Imaging Spectrometry VIII
Sylvia S. Shen, Editor(s)

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