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Proceedings Paper

Wave-optical analysis of submicron focusing of hard x-ray beams by reflective optics
Author(s): Kazuto Yamauchi; Kazuya Yamamura; Hidekazu Mimura; Yasuhisa Sano; Akira Saito; Masahiko Kanaoka; Katsuyoshi Endo; Alexei Souvorov; Makina Yabashi; Kenji Tamasaku; Tetsuya Ishikawa; Yuzo Mori
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Paper Abstract

Focusing methods using mirror optics are intensively studied in the field of X-ray microscopy because mirror optics has useful features such as high photon efficiency and no chromatic aberrations. Employing a wave-optical method, we investigated the relationship between the natures of figure errors on the mirror surface and optics performances such as sizes, intensities and satellite peak structures of the focused X-ray beam. We also evaluated uniformity of intensity in the spherically diverging beam from the focal point as a point source. Obtained results showed unprecedented degrees of surface figure accuracy such as higher than 1nm in all over the spatial wavelength range longer than 0.5mm was required to realize nearly diffraction-limited focusing including satellite structures and intensity flatness at the spherically diverging wavefront.

Paper Details

Date Published: 24 December 2002
PDF: 6 pages
Proc. SPIE 4782, X-Ray Mirrors, Crystals, and Multilayers II, (24 December 2002); doi: 10.1117/12.453752
Show Author Affiliations
Kazuto Yamauchi, Osaka Univ. (Japan)
Kazuya Yamamura, Osaka Univ. (Japan)
Hidekazu Mimura, Osaka Univ. (Japan)
Yasuhisa Sano, Osaka Univ. (Japan)
Akira Saito, Osaka Univ. (Japan)
Masahiko Kanaoka, Osaka Univ. (Japan)
Katsuyoshi Endo, Osaka Univ. (Japan)
Alexei Souvorov, SPring-8/Japan Synchrotron Radiation Research Institute (Japan)
Makina Yabashi, SPring-8/Japan Synchrotron Radiation Research Institute (Japan)
Kenji Tamasaku, SPring-8/RIKEN (Japan)
Tetsuya Ishikawa, SPring-8/RIKEN (Japan)
Yuzo Mori, Osaka Univ. (Japan)

Published in SPIE Proceedings Vol. 4782:
X-Ray Mirrors, Crystals, and Multilayers II
Andreas K. Freund; Albert T. Macrander; Tetsuya Ishikawa; James L. Wood, Editor(s)

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