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Proceedings Paper

New metric for 3D optical pattern recognition system
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Paper Abstract

In this paper, a novel metric is defined that will allow one to compare the performance of 3-D pattern recognition systems. Any real object is inherently, three-dimensional. Therefore, any input object for an automated target recognition system should be ideally compared to the 3-D information about the object. The proposed metric captures the essence of such comparisons.

Paper Details

Date Published: 15 November 2002
PDF: 8 pages
Proc. SPIE 4788, Photonic Devices and Algorithms for Computing IV, (15 November 2002); doi: 10.1117/12.453729
Show Author Affiliations
Abdul Ahad Sami Awwal, Lawrence Livermore National Lab. (United States)
Karl Solvi Gudmundsson, Wright State Univ. (United States)
M. Tabrez, Wright State Univ. (United States)
M. Rahman, Wright State Univ. (United States)
Mohammad S. Alam, Univ. of South Alabama (United States)
Khan M. Iftekharuddin, Univ. of Memphis (United States)


Published in SPIE Proceedings Vol. 4788:
Photonic Devices and Algorithms for Computing IV
Khan M. Iftekharuddin; Abdul Ahad S. Awwal, Editor(s)

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