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Proceedings Paper

Accuracy of imaging spectroscopy for geologic material identification: analysis of noise effects
Author(s): Maria A. Sgavetti; Alessandra Gaibazzi; Ilaria Longhi; Sandro Meli; Claudia Giardino; Rosanna Capelletti; Andrea Baraldi; Marco Crotti
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Paper Abstract

Noisy spectra were simulated from laboratory 2000-2500 nm reflectance spectra of polymineralic sand samples and synthetic composite spectra, using MIVIS calibration parameters and measured solar irradiance both with and without diffuse atmospheric radiance at the sensor. Noise content variation in output data with varying sensor parameters and atmospheric conditions was analysed, as well as noise effects in spectral feature identification. Scaled random noise with a normal distribution was added to the convolved spectra. The rms of the ratio of noisy to original spectra is assumed to represent noise content in output data. Noise content variation with SNR is expressed by a set of curves with a significant dispersion of noisy spectra for low SNRs. For individual SNRs, noise content has an inverse linear relationship with sample albedo. Data dispersion occurs when noise content is compared with reflectance contrast and band depth. No clear relationship resulted for noisy to original spectra match values or noisy spectra classification probability with either band depth or band depth referred noise, due to spectra aliases.

Paper Details

Date Published: 23 January 2002
PDF: 12 pages
Proc. SPIE 4545, Remote Sensing for Environmental Monitoring, GIS Applications, and Geology, (23 January 2002); doi: 10.1117/12.453672
Show Author Affiliations
Maria A. Sgavetti, Univ. degli Studi di Parma (Italy)
Alessandra Gaibazzi, Univ. degli Studi di Parma (Italy)
Ilaria Longhi, Univ. degli Studi di Parma (Italy)
Sandro Meli, Univ. degli Studi di Parma (Italy)
Claudia Giardino, CNR-IRRS (Italy)
Rosanna Capelletti, Univ. degli Studi di Parma (Italy)
Andrea Baraldi, Univ. degli Studi di Parma (Italy)
Marco Crotti, Univ. degli Studi di Parma (Italy)


Published in SPIE Proceedings Vol. 4545:
Remote Sensing for Environmental Monitoring, GIS Applications, and Geology
Manfred Ehlers, Editor(s)

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